Image: Douglas Hall, Ph.D., Microscopy & Microanalysis Facility, UNB

ELECTRON MICROPROBE

X-ray microanalysis can be used to determine the elemental composition of solid materials, or to detect the presence of specific elements within them. The electron microprobe is equipped with automation software and both wavelength and energy dispersive spectrometers for efficient, fully automated analyses.

IMAGING TECHNIQUES

• Secondary electron imaging (morphology and surface topography)
• Backscattered electron imaging (compositional contrast and phase distribution)
• X-ray imaging (compositional contrast and phase distribution)

ANALYTICAL MODES

• Elemental recognition and phase identification
• Quantitative compositional analysis
• Automated multipoint analyses
• Digital x-ray maps and linescans

INSTRUMENTATION

JEOL JXA-733 MICROPROBE with:

• 4 2-crystal, wavelength dispersive spectrometers
  (LDE1, TAP, PET, LIF crystals)
• Geller Microanalytical automation control
  (dSspec, dQant32, dPict32)
• PGT Prism 2000 energy dispersive spectrometer
• PGT Spirit X-ray analysis system